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Discrete Retardance Second Harmonic Generation Ellipsometry

Discrete Retardance Second Harmonic Generation Ellipsometry

Christopher J Dehen, R Michael Everly, Ryan M Plocinik, Hartmut G Hedderich, Garth J Simpson

Rev Sci Instrum. 2007 Jan;78(1):013106.

PMID: 17503906

Abstract:

A new instrument was constructed to perform discrete retardance nonlinear optical ellipsometry (DR-NOE). The focus of the design was to perform second harmonic generation NOE while maximizing sample and application flexibility and minimizing data acquisition time. The discrete retardance configuration results in relatively simple computational algorithms for performing nonlinear optical ellipsometric analysis. NOE analysis of a disperse red 19 monolayer yielded results that were consistent with previously reported values for the same surface system, but with significantly reduced acquisition times.

Chemicals Related in the Paper:

Catalog Number	Product Name	Structure	CAS Number	Price
AP2734523	Disperse Red 19		2734-52-3	Price

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