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Evidence of a minority monoclinic LaNiO 2.5 phase in lanthanum nickelate thin films

Evidence of a minority monoclinic LaNiO 2.5 phase in lanthanum nickelate thin films

L López-Conesa, J M Rebled, D Pesquera, N Dix, F Sánchez, G Herranz, J Fontcuberta, C Magén, M J Casanove, S Estradé, F Peiró

Phys Chem Chem Phys. 2017 Mar 29;19(13):9137-9142.

PMID: 28317997

Abstract:

LaNiO3 (LNO) thin films of 14 nm and 35 nm thicknesses grown epitaxially on LaAlO3 (LAO) and (LaAlO3)0.3(Sr2TaAlO6)0.7 (LSAT) substrates are studied using High Resolution Transmission Electron Microscopy (HRTEM) and High Angle Annular Dark Field (HAADF) imaging. The strain state of the films is studied using Geometric Phase Analysis (GPA). Results show the successful in-plane adaptation of the films to the substrates, both in the compressive (LAO) and tensile (LSAT) cases. Through the systematic analysis of HRTEM superstructure contrast modulation along different crystal orientations, localized regions of the monoclinic LaNiO2.5 phase are detected in the 35 nm films.

Chemicals Related in the Paper:

Catalog Number	Product Name	Structure	CAS Number	Price
AP12031413	Lanthanum nickelate		12031-41-3	Price

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