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Impact of Surface Wettability on S-layer Recrystallization: A Real-Time Characterization by QCM-D

Impact of Surface Wettability on S-layer Recrystallization: A Real-Time Characterization by QCM-D

Jagoba Iturri, Ana C Vianna, Alberto Moreno-Cencerrado, Dietmar Pum, Uwe B Sleytr, José Luis Toca-Herrera

Beilstein J Nanotechnol. 2017 Jan 11;8:91-98.

PMID: 28144568

Abstract:

Quartz crystal microbalance with dissipation monitoring (QCM-D) has been employed to study the assembly and recrystallization kinetics of isolated SbpA bacterial surface proteins onto silicon dioxide substrates of different surface wettability. Surface modification by UV/ozone oxidation or by vapor deposition of 1H,1H,2H,2H-perfluorododecyltrichlorosilane yielded hydrophilic or hydrophobic samples, respectively. Time evolution of frequency and dissipation factors, either individually or combined as the so-called Df plots, showed a much faster formation of crystalline coatings for hydrophobic samples, characterized by a phase-transition peak at around the 70% of the total mass adsorbed. This behavior has been proven to mimic, both in terms of kinetics and film assembly steps, the recrystallization taking place on an underlying secondary cell-wall polymer (SCWP) as found in bacteria. Complementary atomic force microscopy (AFM) experiments corroborate these findings and reveal the impact on the final structure achieved.

Chemicals Related in the Paper:

Catalog Number	Product Name	Structure	CAS Number	Price
AP102488493	1H,1H,2H,2H-Perfluorododecyltrichlorosilane		102488-49-3	Price

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