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Measurements of the Thickness Compressibility of an N-Octadecyltriethoxysilane Monolayer Self-Assembled on Mica

Measurements of the Thickness Compressibility of an N-Octadecyltriethoxysilane Monolayer Self-Assembled on Mica

Sungsoo Kim, Kilwon Cho, Joan E Curry

Langmuir. 2005 Aug 30;21(18):8290-6.

PMID: 16114933

Abstract:

The surface forces apparatus technique and the Johnson-Kendall-Roberts theory were used to study the elastic properties of an n-octadecyltriethoxysilane self-assembled monolayer (OTE-SAM) on both untreated and plasma-treated mica. Our aim was to measure the thickness compressibilities of OTE monolayers on untreated and plasma-treated mica and to estimate their surface densities and phase-states from the film compressibility. The compressibility moduli of OTE are (0.96 +/- 0.02) x 10(8) N/m(2) on untreated mica and (1.24 +/- 0.06) x 10(8) N/m(2) on plasma-treated mica. This work suggests that the OTE phase-state is pseudocrystalline. In addition, the results from the compressibility measurements in water vapor suggest that the OTE-SAM on both untreated and plasma-treated mica is not homogeneous but rather contains both crystalline polymerized OTE domains and somewhat hydrophilic gaseous regions.

Chemicals Related in the Paper:

Catalog Number	Product Name	Structure	CAS Number	Price
AP7399000	n-Octadecyltriethoxysilane		7399-00-0	Price

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