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Surface Thiolation of Silicon for Antifouling Application

Surface Thiolation of Silicon for Antifouling Application

Xiaoning Zhang, Pei Gao, Valerie Hollimon, DaShan Brodus, Arion Johnson, Hongmei Hu

Chem Cent J. 2018 Feb 7;12(1):10.

PMID: 29411153

Abstract:

Thiol groups grafted silicon surface was prepared as previously described. 1H,1H,2H,2H-perfluorodecanethiol (PFDT) molecules were then immobilized on such a surface through disulfide bonds formation. To investigate the contribution of PFDT coating to antifouling, the adhesion behaviors of Botryococcus braunii (B. braunii) and Escherichia coli (E. coli) were studied through biofouling assays in the laboratory. The representative microscope images suggest reduced B. braunii and E. coli accumulation densities on PFDT integrated silicon substrate. However, the antifouling performance of PFDT integrated silicon substrate decreased over time. By incubating the aged substrate in 10 mM TCEP·HCl solution for 1 h, the fouled PFDT coating could be removed as the disulfide bonds were cleaved, resulting in reduced absorption of algal cells and exposure of non-fouled silicon substrate surface. Our results indicate that the thiol-terminated substrate can be potentially useful for restoring the fouled surface, as well as maximizing the effective usage of the substrate.

Chemicals Related in the Paper:

Catalog Number	Product Name	Structure	CAS Number	Price
AP34143743	1H,1H,2H,2H-Perfluorodecanethiol		34143-74-3	Price

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