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Thermally Induced Anchoring of Fullerene in Copolymers With Si-bridging Atom: Spectroscopic Evidences

Thermally Induced Anchoring of Fullerene in Copolymers With Si-bridging Atom: Spectroscopic Evidences

Cleber F N Marchiori, Yunier Garcia-Basabe, Fabio de A Ribeiro, Marlus Koehler, Lucimara S Roman, Maria Luiza M Rocco

Spectrochim Acta A Mol Biomol Spectrosc. 2017 Jan 15;171:376-382.

PMID: 27569770

Abstract:

We use X-ray photoelectron spectroscopy (XPS), Near-edge X-ray absorption fine structure (NEXAFS), resonant Auger spectroscopy (RAS), Attenuation Total Reflection Infrared (ATR-IR) and Atomic Force Microscopy (AFM) to study the blend between the copolymer poly[2,7-(9,9-bis(2-ethylhexyl)-dibenzosilole)-alt-4,7-bis(thiophen-2-yl)benzo-2,1,3-thiadiazole] (PSiF-DBT) and the fullerene derivative PC71BM submitted to different annealing temperatures. Those measurements indicate that there is an incidental anchoring of a fullerene derivative to the Si-bridging atoms of a copolymer induced by thermal annealing of the film. Insights about the physical properties of one possible PSiF-DBT/PC71BM anchored structure are obtained using Density Functional Theory calculations. Since the performance of organic photovoltaic based on polymer-fullerene blends depends on the chemical structure of the blend components, the anchoring effect might affect the photovoltaic properties of those devices.

Chemicals Related in the Paper:

Catalog Number	Product Name	Structure	CAS Number	Price
AP1004272927	PSiF-DBT		1004272-92-7	Price

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